Articles / Conference Presentation

June, 2010
Enhanced Productivity and Higher Yields of Photomasks
NanoPhotonics, Mainz, Germany releases a new series of automatic mask inspectionsystems enabling higher inspection frequency at lower inspection cost per mask... read article

December, 2009, Semiconductor International
ISMI 450 mm Program Moving to Next Stage
The Sematech 450 mm wafer transition program is moving beyond the wafer-handling effort to development of wafer processing and metrology equipment... read article

November, 2009, EPP Europe
450 mm Surface and Edge Defect Inspection
NanoPhotonics provided International Sematech Manufacturing Initiative (ISMI) with 450 mm surface and 450 mm edge defect inspection tools. Both tools are based on the proven design of the companies' bolts compatible MetriCube series... read article

October, 2009
Bare Wafer Defect Inspection Technology – Enabler for Early Stage 450 mm Development
Oral Paper by Michael Abraham held at the Conference “450mm in Europe – Quo Vadis?”, SEMICON Europa, Wednesday, 7 October, Messe Dresden, Dresden, Germany... read article

October, 2009, Semiconductor International
ISMI 450 mm Program Moving to Next Stage
The ISMI 450 mm wafer program is moving to a new stage, going beyond wafer handling to blanket film deposition and metrology... read article

July, 2009, Semiconductor International
ISMI to Report Progress at SEMICON West
At next week's SEMICON West show, ISMI will meet the supplier community to discuss progress with the 450 mm and Next Generation Factory programs... read article

Press releases

February, 2009, Semiconductor International
NanoPhotonics to Ship 450 mm Wafer Inspection Tools
to ISMI
NanoPhotonics will send two of its 450 mm wafer inspection tools to the ISMI Interoperability Test Bed, where early studies of 450 mm wafers and wafer handling equipment are underway... read article

September, 2008, Ricmar / NanoPhotonics
NanoPhotonics now part of the growing Ricmar Group
Ricmar Beteiligungs GmbH, with Gerhard Zeindl as its CEO announces today that it has finalized the purchase of a majority stake in NanoPhotonics GmbH... read article

Events & News

NanoPhotonics GmbH honored with the “Success 2010 Innovation Award” from the German State of Rheinland-Pfalz

June 2010, ISB Bank Rhineland-Palatinate Germany, awarded regional high tech companies for successful Product- / and Process Development.

Unlike similar prizes, the “Success 2010 Innovation Award” from the German State of Rhineland-Palatinate, does not only recognize product innovation, but rather product-/ and process innovations that already have been successfully introduced and established in the market.

7 companies were nominated in total, including NanoPhotonics.

Hendrik Hering, minister of economic affairs, finally awarded NanoPhotonics with 2nd Place of the “Success 2010 Innovation Award” for their achievements in the development and market introduction of the first 450mm wafer inspection system.

Next generation 450mm wafer technologies are gradually entering into pilot-phase at leading wafer manufacturers.

NanoPhotonics was able to deliver the world’s first system to International SEMATECH Manufacturing Initiative (ISMI), USA.

ISMI is a wholly owned subsidiary of SEMATECH, dedicated to helping improve the productivity and cost performance of equipment and manufacturing operations. It utilizes the NP Inspection System successfully to test 450mm wafers from Intel, Samsung and TSMC.

For further information, please contact sales@nanophotonics.de