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Articles / Conference Presentation

December, 2009, Semiconductor International
ISMI 450 mm Program Moving to Next Stage
The Sematech 450 mm wafer transition program is moving beyond the wafer-handling effort to development of wafer processing and metrology equipment... read article

November, 2009, EPP Europe
450 mm Surface and Edge Defect Inspection
NanoPhotonics provided International Sematech Manufacturing Initiative (ISMI) with 450 mm surface and 450 mm edge defect inspection tools. Both tools are based on the proven design of the companies' bolts compatible MetriCube series... read article

October, 2009
Bare Wafer Defect Inspection Technology – Enabler for Early Stage 450 mm Development
Oral Paper by Michael Abraham held at the Conference “450mm in Europe – Quo Vadis?”, SEMICON Europa, Wednesday, 7 October, Messe Dresden, Dresden, Germany... read article

October, 2009, Semiconductor International
ISMI 450 mm Program Moving to Next Stage
The ISMI 450 mm wafer program is moving to a new stage, going beyond wafer handling to blanket film deposition and metrology... read article

July, 2009, Semiconductor International
ISMI to Report Progress at SEMICON West
At next week's SEMICON West show, ISMI will meet the supplier community to discuss progress with the 450 mm and Next Generation Factory programs... read article

February, 2009, Semiconductor International
NanoPhotonics to Ship 450 mm Wafer Inspection Tools
to ISMI

NanoPhotonics will send two of its 450 mm wafer inspection tools to the ISMI Interoperability Test Bed, where early studies of 450 mm wafers and wafer handling equipment are underway... read article


Press releases

September, 2008, Ricmar / NanoPhotonics
NanoPhotonics now part of the growing Ricmar Group
Ricmar Beteiligungs GmbH, with Gerhard Zeindl as its CEO announces today that it has finalized the purchase of a majority stake in NanoPhotonics AG... read article

 

 

Events & News

NanoPhotonics will be present at:

PMJ - Photomask Japan

 

Photomask Japan 2010

Date: 13 April – 14 April 2010
Location: Yokohama
Sponsored by SEMI Japan with a booth showing the companies offering for mask blank and reticle inspection.

 

SMT Nuremberg LogoSMT Nuremberg


Date: 8 June – 10 June 2010
Location: Nuremberg
Booth No: 7-524
Exhibitor:
NanoPhotonics AG
Provac AG
Ricmar Sales & Service GmbH
Ricmar Technology GmbH

 


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